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SUMMARY:Substrate noise isolation technique for mixed-signal ASICs in part
 icle physics instrumentation
DTSTART;VALUE=DATE-TIME:20161014T063000Z
DTEND;VALUE=DATE-TIME:20161014T070000Z
DTSTAMP;VALUE=DATE-TIME:20260720T013732Z
UID:indico-contribution-557@cern.ch
DESCRIPTION:Speakers: Malankin Evgeny (NRNU MEPHI)\nThe paper describes me
 thodology of substrate noise isolation for ASICs implemented in the CMOS p
 rocesses. Up-to-date CMOS technologies allow embedding the digital process
 ing blocks into the same die as the readout analog part. This significantl
 y improves the functionality and complexity of the readout ASICs. In fact 
 performance of the precision analog circuits (e.g. charge sensitive amplif
 ier\, shaper\, etc.) can suffer from the additional noise contribution fro
 m the high-frequency digital part. This work describes the ways of decreas
 e the substrate noise influence on the sensitive circuits of the readout c
 hannels. Simulation results and comparison of different isolation approach
 es are considered in the paper.\n\nhttps://indico.particle.mephi.ru/event/
 4/contributions/557/
LOCATION:Milan Hotel Hall of the 2nd floor
URL:https://indico.particle.mephi.ru/event/4/contributions/557/
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