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SUMMARY:Measurement of the volt-ampere characteristic of SiPM on wafer lev
 el with setup based on PA200 BlueRay probe station
DTSTART;VALUE=DATE-TIME:20161014T121500Z
DTEND;VALUE=DATE-TIME:20161014T124500Z
DTSTAMP;VALUE=DATE-TIME:20260712T093912Z
UID:indico-contribution-628@cern.ch
DESCRIPTION:Speakers: Fred Kayumov (Lebedev Physical Institute)\, Pavel Bu
 zhan (MEPhI)\nSetup for measurement of the volt-ampere characteristics of 
 SiPMs on wafer level consists of probe station PA200 BlueRay\, source-mete
 r Keithley 2400 and computer. Controlling of the setup performed by specia
 l program which allows tune the accuracy and speed of the measurement by s
 electing averaging mode and integration time of Keithley 2400 and by const
 ructing the custom logic of the measurement.\n\nhttps://indico.particle.me
 phi.ru/event/4/contributions/628/
LOCATION:Milan Hotel Hall of the 2nd floor
URL:https://indico.particle.mephi.ru/event/4/contributions/628/
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