BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//CERN//INDICO//EN
BEGIN:VEVENT
SUMMARY:Layout-aware Soft Error Rate Estimation Technique for Integrated C
 ircuits under the Environment with Energetic Charged Particles
DTSTART;VALUE=DATE-TIME:20161014T114500Z
DTEND;VALUE=DATE-TIME:20161014T120000Z
DTSTAMP;VALUE=DATE-TIME:20260714T041848Z
UID:indico-contribution-706@cern.ch
DESCRIPTION:Speakers: Anton Balbekov (SRISA)\nThis work considers the tech
 nique for modeling of multiple errors caused by charged particles in sub-1
 00 nm devices. This technique estimates the Soft Error Rate taking into ac
 count layout of integrated circuit. Comparison of simulated data with data
  from experiments on testing  facilities is provided.\n\nhttps://indico.pa
 rticle.mephi.ru/event/4/contributions/706/
LOCATION:Milan Hotel Vivaldi-Boccerini
URL:https://indico.particle.mephi.ru/event/4/contributions/706/
END:VEVENT
END:VCALENDAR