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SUMMARY:INVESTIGATION OF SECONDARY ELECTRON EMISSION PROCESSES USING A MUL
 TI-WIRE MONITORING SYSTEM FOR CHARGED-PARTICLE AND HEAVY-ION BEAMS
DTSTART;VALUE=DATE-TIME:20261027T162500Z
DTEND;VALUE=DATE-TIME:20261027T163000Z
DTSTAMP;VALUE=DATE-TIME:20261022T104528Z
UID:indico-contribution-6449@cern.ch
DESCRIPTION:Speakers: Egor Zemlin (Saint Petersburg State University)\nSec
 ondary electron emission is the process of electron emission from the surf
 ace of a material (target) under bombardment by beams of charged particles
  and heavy ions. The study of this process is challenging due to the need 
 for accurate measurements of both the incident beam current and the total 
 current of secondary electrons emitted from the target. Secondary electron
  emission is a surface process\, with a secondary-particle escape depth of
  approximately 5 nm [1]. Therefore\, refractory materials coated with a th
 in layer of the material under investigation are commonly used as targets.
  A representative example is a gold-coated tungsten wire\, which serves as
  a sensor. An array of such sensors forms a wire-grid beam profile monitor
  [2]. The use of this type of detector for monitoring the spatial distribu
 tion of charged particles or heavy ions extracted from an accelerator make
 s it possible to determine the beam profile\, i.e.\, the transverse distri
 bution of beam density. Beam particles interact with the sensors and eject
  secondary electrons from their surfaces. As a result\, each sensor acts a
 s a current source. The ratio of the total beam current to the total secon
 dary electron current is referred to as the secondary electron emission co
 efficient.\nIn this work\, a multi-wire beam monitoring system for charged
  particles and heavy ions\, developed at Saint Petersburg State University
  (SPbU) [2]\, was used as the experimental setup. An important feature of 
 this system is the use of sensor electrodes made of different materials an
 d alloys. This makes it possible to determine the secondary electron emiss
 ion coefficients of various materials and alloys interacting with beams of
  both light charged particles and heavy ions over a wide energy range.\nEx
 perimental data on secondary electron emission coefficients were obtained 
 at the Unique Scientific Facility (USF) “A.F. Ioffe Institute of Physics
  and Technology U-120 Cyclotron” using 3 MeV proton beams and 53 MeV ^40
 Ar^8+ ion beams. During the experiments\, the profiles of both beams were 
 visualized\, and the parameters of the signals generated by the sensors up
 on interaction with the beam particles were investigated. Processing of th
 e experimental data allowed\, for the first time\, the determination of th
 e secondary electron emission coefficients of the sensor material (gold-co
 ated tungsten) under irradiation by proton and argon-ion beams in the inve
 stigated energy range. These results provide a basis for validating theore
 tical descriptions of secondary electron emission processes induced by int
 eractions of low- and intermediate-energy charged particles and heavy ions
  with matter.\n\nThis work was supported by St. Petersburg State Universit
 y (project ID: 153212394).\n \nREFERENCES\n\n1.	Bronshtein I. M.\, Fraim
 an B. S. Secondary Electron Emission. — Moscow: Nauka\, 1969. 408 p.\n2.
 	Zherebchevsky V. I.\, Zemlin E. O.\, Maltsev N. A. Multisensor system for
  monitoring charged particle and heavy ion beams. RF Patent No. 2830097\, 
 Cl. G01T 1/34 (2024.08).\n\nhttps://indico.particle.mephi.ru/event/626/con
 tributions/6449/
LOCATION:Sevastopol hotel Conference Hall 1
URL:https://indico.particle.mephi.ru/event/626/contributions/6449/
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